Original price was: $109.00.$24.99Current price is: $24.99.
Access Power-Aware Testing and Test Strategies for Low Power Devices 1st Edition Now. Discount up to 90%
| Full Title | Power-Aware Testing and Test Strategies for Low Power Devices 1st Edition |
|---|---|
| Author(s) | Patrick Girard, Nicola Nicolici, Xiaoqing Wen |
| Edition | 1st Edition |
| ISBN | 9781441909282, 9781441909275 |
| Publisher | Springer |
| Format | PDF and EPUB |
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
Book Instantly Available.
Safe Payment with PayPal and Stripe
24/7 Customer Service
