Optical Characterization of Real Surfaces and Films Advances in Research and Development
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Optical Characterization of Real Surfaces and Films Advances in Research and Development

SKU: 9781483288932

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Full Title

Optical Characterization of Real Surfaces and Films Advances in Research and Development
Author(s)
Edition
ISBN

9781483288932, 9780125330190
Publisher

Academic Press
Format

PDF and EPUB

Description

This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.

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