Nanoscale Redox Reaction at Metal/Oxide Interface A Case Study on Schottky Contact and ReRAM
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Nanoscale Redox Reaction at Metal/Oxide Interface A Case Study on Schottky Contact and ReRAM

SKU: 9784431548508

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Additional information

Full Title

Nanoscale Redox Reaction at Metal/Oxide Interface A Case Study on Schottky Contact and ReRAM
Author(s)

Takahiro Nagata
Edition
ISBN

9784431548508, 9784431548492
Publisher

Springer
Format

PDF and EPUB

Description

Oxide materials are good candidates for replacing Si devices, which are increasingly reaching their performance limits, since the former offer a range of unique properties, due to their composition, design and/or doping techniques.   The author introduces a means of selecting oxide materials according to their functions and explains metal/oxide interface physics. As he demonstrates, material development is the key to matching oxide materials to specific practical applications. In this book, the investigation and intentional control of metal/oxide interface structure and electrical properties using data obtained with non-destructive methods such as x-ray photoelectron spectroscopy (XPS) and x-ray reflectometry (XRR) are discussed. Further, it shows how oxide materials can be used to support the development of future functional devices with high-k, ferroelectric, magnetic and optical properties. In closing, it explains optical sensors as an application of metal Schottky contact and metal/oxide resistive random access memory structure.

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