Nanoscale Memory Repair
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Nanoscale Memory Repair

SKU: 9781441979582

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Additional information

Full Title

Nanoscale Memory Repair
Author(s)

Masashi Horiguchi, Kiyoo Itoh
Edition
ISBN

9781441979582, 9781461427940, 9781441979575
Publisher

Springer
Format

PDF and EPUB

Description

Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.

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