EM Material Characterization Techniques for Metamaterials
-55%
Availability: In Stock

EM Material Characterization Techniques for Metamaterials

SKU: 9789811065170

Original price was: $54.99.Current price is: $24.99.

Access EM Material Characterization Techniques for Metamaterials Now. Discount up to 90%

Categories: ,

Additional information

Full Title

EM Material Characterization Techniques for Metamaterials
Author(s)

Raveendranath U. Nair, Maumita Dutta, Mohammed Yazeen P.S., K. S. Venu
Edition
ISBN

9789811065170, 9789811065163
Publisher

Springer
Format

PDF and EPUB

Description

This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials  

Related products