Additional information
Full Title | Design and Analysis of Accelerated Tests for Mission Critical Reliability 1st Edition |
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Author(s) | Michael J. LuValle, Bruce G. LeFevre, SirRaman Kannan |
Edition | 1st Edition |
ISBN | 9781135436186, 9781584884712, 9780429208836, 9781135436148, 9780203492031 |
Publisher | Chapman & Hall |
Format | PDF and EPUB |