Bias Temperature Instability for Devices and Circuits
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Bias Temperature Instability for Devices and Circuits

SKU: 9781461479093

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Full Title

Bias Temperature Instability for Devices and Circuits
Author(s)
Edition
ISBN

9781461479093, 9781461479086
Publisher

Springer
Format

PDF and EPUB

Description

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

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