Arbitrary Modeling of TSVs for 3D Integrated Circuits
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Arbitrary Modeling of TSVs for 3D Integrated Circuits

SKU: 9783319076119

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Additional information

Full Title

Arbitrary Modeling of TSVs for 3D Integrated Circuits
Author(s)

Khaled Salah, Yehea Ismail, Alaa El-Rouby
Edition
ISBN

9783319076119, 9783319076102
Publisher

Springer
Format

PDF and EPUB

Description

This book presents a wide-band and technology independent, SPICE-compatible RLC model for through-silicon vias (TSVs) in 3D integrated circuits. This model accounts for a variety of effects, including skin effect, depletion capacitance and nearby contact effects. Readers will benefit from in-depth coverage of concepts and technology such as 3D integration, Macro modeling, dimensional analysis and compact modeling, as well as closed form equations for the through silicon via parasitics. Concepts covered are demonstrated by using TSVs in applications such as a spiral inductor and inductive-based communication system and bandpass filtering.

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