Analytical Techniques for Thin Films Treatise on Materials Science and Technology, Vol. 27
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Analytical Techniques for Thin Films Treatise on Materials Science and Technology, Vol. 27

SKU: 9781483218311

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Additional information

Full Title

Analytical Techniques for Thin Films Treatise on Materials Science and Technology, Vol. 27
Author(s)
Edition
ISBN

9781483218311, 9780123418272
Publisher

Academic Press
Format

PDF and EPUB

Description

Treatise on Materials Science and Technology, Volume 27: Analytical Techniques for Thin Films covers a set of analytical techniques developed for thin films and interfaces, all based on scattering and excitation phenomena and theories. The book discusses photon beam and X-ray techniques; electron beam techniques; and ion beam techniques. Materials scientists, materials engineers, chemical engineers, and physicists will find the book invaluable.

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