Additional information
| Full Title | Advances in Imaging and Electron Physics: Part A |
|---|---|
| Author(s) | Cremer, Jr., Jay Theodore |
| Edition | |
| ISBN | 9780123944221, 9780123978141 |
| Publisher | Academic Press |
| Format | PDF and EPUB |
Availability: In Stock
Advances in Imaging and Electron Physics: Part A
SKU: 9780123944221
Original price was: $238.00.$24.99Current price is: $24.99.
Access Advances in Imaging and Electron Physics: Part A Now. Discount up to 90%
Book Information
Description
Description
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.
Key features:
* Contributions from leading authorities * Informs and updates on all the latest developments in the field
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Advances in Imaging and Electron Physics: Part A
SKU: 9780123978141
Original price was: $238.00.$24.99Current price is: $24.99.
Access Advances in Imaging and Electron Physics: Part A Now. Discount up to 90%
Book Information
Additional information
| Full Title | Advances in Imaging and Electron Physics: Part A |
|---|---|
| Author(s) | Cremer, Jr., Jay Theodore |
| Edition | |
| ISBN | 9780123978141, 9780123944221 |
| Publisher | Academic Press |
| Format | PDF and EPUB |
Description
Description
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.
Key features:
* Contributions from leading authorities * Informs and updates on all the latest developments in the field
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